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FormFactor Inc. | Semiconductor Test and MeasurementIndustry leader providing advanced solutions for on-wafer test and measurement, including engineering probe stations, analytical probes, probe cards, and 3D surface metrology.FormFactor Inc. | Semiconductor Test and Measurement Skip to content ProductsApplicationsIndustriesSales & ServiceCompanyOverviewProbe SystemsProbesProbe CardsQuantum CryogenicsOverviewSemiconductor R&DHigh Volume ManufacturingPartner SolutionsPublications & ResourcesOverviewIndustries OverviewOverviewContact UsProduct SupportAdditional ProgramsTest/Measurement ServicesCompany InformationCareersInvestorsNews, Events and MediaCustomer CollaborationModular Systems150 mm Systems200 mm Systems300 mm SystemsDedicated SystemsAutonomous AssistantsHigh Volume ManufacturingPower SystemsVacuum/Pressure SystemsCryogenic SystemsIntegrated SystemsWith KeysightAdditional ProductsSoftwareAccessoriesProducts/ProgramsView All Probe SystemsSingle/Dual Channel RFSingle/Dual Broadband CoaxialBanded WaveguideCryo/Vacuum/Hi-TempSignal IntegritySpecialtyMixed Signal RF and DCRF MulticontactDC MulticontactHigh Performance DCDC ParametricDC PowerOptical ProbesPharos™ Probe SeriesLightwave Probe (Single Fiber)VNA Calibration ToolsSubstratesSoftwareSupportProduct SupportView All Probe ProductsDRAMFlashFoundry & LogicParametricOpticalRFView All Probe CardsProbe SystemsWafer/Multi-chip SystemsChip-scale SystemsCryostatsDilution RefrigeratorsAdditional ProductsCryogenic Test ServiceView All Cryogenic ProductsDC Parametric TestLow Frequency NoisePower SemiconductorsRF/mmW and 5GTerahertzmm-Wave Load-PullSilicon PhotonicsVCSELs and MicroLEDsQuantum ComputingCryogenic DevicesView All R&D ApplicationsFoundry and LogicDRAM and Flash MemoryAdvanced PackagingRF/mmW and 5GAI ProcessorsOptical Wafer TestParametric TestCryogenic DevicesView All HVM ApplicationsMeasureOneMeasureOne Program Overview1/f Device CharacterizationCircuit CharacterizationCryogenic / Magnetic ProbingPower Semiconductor ProbingRF Tuning & Load-PullS-Parameter & DC ParametricSilicon Photonics TestTerahertz ProbingTechnical PapersCase StudiesTest Insights PresentationsDocumentation and DownloadsComputing, Data Centers, and Quantum5G and 6G CommunicationsAutomotiveAerospace and DefenseGlobal LocationsSales RepresentativesContact SalesParts & Service RequestFormFactor RMACascade RMAProbe Systems SupportAnalytical Probe SupportAnalytical Probe RepairPyramid Probe Card SupportWinCal SupportDocumentation & DownloadsEquipment FinancingEducational SavingsLogistics ServiceCryogenic TestCompany ProfileOur HistoryLeadershipBoard of DirectorsCorporate CitizenshipSecurity & ComplianceWorking @ FormFactorUnited StatesGermanySee All Job OpeningsRecruitment Privacy PolicyInvestor RelationsWebinarsBlogPodcastsPress ReleasesCOMPASS Users ConferenceLab to FabAccelerating ProfitabilitySharing Expertise BACKMPS150MPS150-SiPhSummitPM8/EPS200See All...Autonomous DCAutonomous RFAutonomous SiPhAutonomous High-PowerTRITON™TeslaIMS-K-mmW/THzIMS-K-Load-PullIMS-K-LFNIMS-K-DCIMS-K-PowerIMS-K-SiPhSee All...VeloxVelox Dash™WinCaleVue MicroscopePositionersChucksVibration Isolation TablesShieldEnclosureCustom Probe SystemsEducational SavingsInfinity Probe (145 GHz)InfinityXF Probe (250 GHz)InfinityXT Probe (110 GHz)|Z| Probe (67 GHz)|Z| Probe® PowerT-Wave Probe (140 GHz-1.1 THz)ACP Probe (110 GHz)Infinity Waveguide (50-500 GHz)T-Wave Probe (140 GHz-1.1 THz)|Z| Probe - Coaxial (67 GHz)ACP Probe (110 GHz)Multi-|Z| Probe (20 GHz)FPC Probe (40-GHz)|Z| Probe® PCB (20 GHz)Resistive Matching and TerminationInfinityQuad Probe (110) GHz)ACP-Q Probe (110 GHz)Unity Probe (20 GHz)Multi-|Z| Probe (20 GHz)QuadCard™ (Probe Dependent)DC-Q ProbeInfinityQuadEye-Pass ProbeWPH ProbeMulti-|Z| ProbeDCP-X ProbeDCP-HTR Series ProbeDCP 100 Series ProbeHigh Current ProbeHigh Voltage ProbeUltra High-Power (UHP)Impedance Standard SubstratesCSR Cal SubstratesMultiline TRL Cal SubstratesWinCalVeloxVelox Dash™Probe SupportProbe RepairWincal SupportPH SeriesSmartMatrixHFTAP SeriesTouchMatrixAltiusKepler™ApolloTrueScaleTakumiHikariPyramid RFIQ3000IQ2000 BaseFlatiron™Enabling TechnologiesWe offer a complete line of premium performance analytical probe stations for on-wafer probing that help increase process performance while reducing cost of ownership.Learn MoreEnabling TechnologyFormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to optimize probe contact accuracy on-wafer -- enabling true, autonomous test.Learn MoreEnabling TechnologyMEMS probes are the integral elements of our advanced wafer probe cards. FormFactor uses MEMS to build millions of tiny robust electrical springs capable of testing ICs over more than a million contact cycles.Learn MoreNext-Gen ProbingThe new InfinityXF™ sets a new benchmark in coaxial wafer probing, delivering true DC–250 GHz broadband performance and fast, repeatable S-parameter measurements enabling streamlined, high-frequency test.Learn MoreEnabling TechnologyFormFactor's FRT Metrology products are now part of Camtek’s wide range of Inspection and Metrology solutions for the Semiconductor industry.Learn MoreEnabling TechnologyFormFactor offers a range of cryogenic test and measurement solutions to quantum engineers. From chip-scale to wafer probing systems, cryostats and magnetometry systems to contract test services, our solutions meet the most challenging requirements.Learn MoreApplicationsFrom the engineering lab to the production test floor, FormFactor’s products enable a wide range of test and measurement applications.Learn MoreIndustriesFormFactor products ensure the quality and reliability of ICs used in electronics affecting every aspect of our lives. Follow the link below for a snapshot of some of the industries we support.Learn MoreSales & ServiceContact us today to learn about our products and services, or find a representative in your area to answer your sales and support questions.Learn MoreCompanyFormFactor is growing. Whether you are looking to invest in your lab, test floor, portfolio or career, we have more information for you here.Learn MoreCloseContact UsProductsApplicationsIndustriesSales & ServiceCompany BACKOverviewProbe SystemsProbesProbe CardsQuantum CryogenicsOverviewSemiconductor R&DHigh Volume ManufacturingPartner SolutionsPublications & ResourcesOverviewIndustries OverviewOverviewContact UsProduct SupportAdditional ProgramsTest/Measurement ServicesCompany InformationCareersInvestorsNews, Events and MediaCustomer Collaboration BACKModular Systems150 mm Systems200 mm Systems300 mm SystemsDedicated SystemsAutonomous AssistantsHigh Volume ManufacturingPower SystemsVacuum/Pressure SystemsCryogenic SystemsIntegrated SystemsWith KeysightAdditional ProductsSoftwareAccessoriesProducts/ProgramsView All Probe SystemsSingle/Dual Channel RFSingle/Dual Broadband CoaxialBanded WaveguideCryo/Vacuum/Hi-TempSignal IntegritySpecialtyMixed Signal RF and DCRF MulticontactDC MulticontactHigh Performance DCDC ParametricDC PowerOptical ProbesPharos™ Probe SeriesLightwave Probe (Single Fiber)VNA Calibration ToolsSubstratesSoftwareSupportProduct SupportView All Probe ProductsDRAMFlashFoundry & LogicParametricOpticalRFView All Probe CardsProbe SystemsWafer/Multi-chip SystemsChip-scale SystemsCryostatsDilution RefrigeratorsAdditional ProductsCryogenic Test ServiceView All Cryogenic ProductsDC Parametric TestLow Frequency NoisePower SemiconductorsRF/mmW and 5GTerahertzmm-Wave Load-PullSilicon PhotonicsVCSELs and MicroLEDsQuantum ComputingCryogenic DevicesView All R&D ApplicationsFoundry and LogicDRAM and Flash MemoryAdvanced PackagingRF/mmW and 5GAI ProcessorsOptical Wafer TestParametric TestCryogenic DevicesView All HVM ApplicationsMeasureOneMeasureOne Program Overview1/f Device CharacterizationCircuit CharacterizationCryogenic / Magnetic ProbingPower Semiconductor ProbingRF Tuning & Load-PullS-Parameter & DC ParametricSilicon Photonics TestTerahertz ProbingTechnical PapersCase StudiesTest Insights PresentationsDocumentation and DownloadsComputing, Data Centers, and Quantum5G and 6G CommunicationsAutomotiveAerospace and DefenseGlobal LocationsSales RepresentativesContact SalesParts & Service RequestFormFactor RMACascade RMAProbe Systems SupportAnalytical Probe SupportAnalytical Probe RepairPyramid Probe Card SupportWinCal SupportDocumentation & DownloadsEquipment FinancingEducational SavingsLogistics ServiceCryogenic TestCompany ProfileOur HistoryLeadershipBoard of DirectorsCorporate CitizenshipSecurity & ComplianceWorking @ FormFactorUnited StatesGermanySee All Job OpeningsRecruitment Privacy PolicyInvestor RelationsWebinarsBlogPodcastsPress ReleasesCOMPASS Users ConferenceLab to FabAccelerating ProfitabilitySharing Expertise BACKMPS150MPS150-SiPhSummitPM8/EPS200See All...Autonomous DCAutonomous RFAutonomous SiPhAutonomous High-PowerTRITON™TeslaIMS-K-mmW/THzIMS-K-Load-PullIMS-K-LFNIMS-K-DCIMS-K-PowerIMS-K-SiPhSee All...VeloxVelox Dash™WinCaleVue MicroscopePositionersChucksVibration Isolation TablesShieldEnclosureCustom Probe SystemsEducational SavingsInfinity Probe (145 GHz)InfinityXF Probe (250 GHz)InfinityXT Probe (110 GHz)|Z| Probe (67 GHz)|Z| Probe® PowerT-Wave Probe (140 GHz-1.1 THz)ACP Probe (110 GHz)Infinity Waveguide (50-500 GHz)T-Wave Probe (140 GHz-1.1 THz)|Z| Probe - Coaxial (67 GHz)ACP Probe (110 GHz)Multi-|Z| Probe (20 GHz)FPC Probe (40-GHz)|Z| Probe® PCB (20 GHz)Resistive Matching and TerminationInfinityQuad Probe (110) GHz)ACP-Q Probe (110 GHz)Unity Probe (20 GHz)Multi-|Z| Probe (20 GHz)QuadCard™ (Probe Dependent)DC-Q ProbeInfinityQuadEye-Pass ProbeWPH ProbeMulti-|Z| ProbeDCP-X ProbeDCP-HTR Series ProbeDCP 100 Series ProbeHigh Current ProbeHigh Voltage ProbeUltra High-Power (UHP)Impedance Standard SubstratesCSR Cal SubstratesMultiline TRL Cal SubstratesWinCalVeloxVelox Dash™Probe SupportProbe RepairWincal SupportPH SeriesSmartMatrixHFTAP SeriesTouchMatrixAltiusKepler™ApolloTrueScaleTakumiHikariPyramid RFIQ3000IQ2000 BaseFlatiron™ Contact Us Semiconductor Test and Measurement We’re paving the shortest path from lab to fab. Learn More When market pressure demands the shortest possible path from concept to volume production, we deliver. We offer a wide range of probe systems, probes, probe cards, quantum cryogenic and thermal management tools to validate ICs at any stage from lab to fab. View All Products Our test expertise spans across various applications including logic, memory, 5G devices, advanced packaging, silicon photonics, and quantum. View All Applications We offer solutions across many industry verticals including computing, leading-edge communications, automotive, energy, aerospace and defense. View All Industries Introducing InfinityXF™ - Broadband 250 GHz Probing Experience unmatched broadband performance up to 250 GHz with InfinityXF™, a high-performance solution for fast, repeatable S-parameter measurements. Powered by FormFactor and Keysight collaboration. Learn More Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges. Contact Sales Introducing the EVOLVITY 300 semi-automated wafer probe system Product Info New Kepler High Parallelism SoC Vertical Probe Card Product Info HPD IQ3000 Fully automated cryogenic wafer probing at 4 K Product Info Innovative MEMS technology enables advanced wafer test. We are the world’s leading manufacturer of MEMS probes, the integral elements of our advanced wafer probe cards. Learn More News, Events & Media Why 3.2T Ethernet Is Pushing Production Wafer Test to 120 GHz Published on October 30, 2026 in Blog Aasutosh Dave on the Future of Semiconductor Test Published on October 23, 2026 in Blog FormFactor, Inc. Reports 2026 Third Quarter Results Published on October 28, 2026 in Press Release FormFactor Opens Farmers Branch Manufacturing Facility to Support Growing Demand for Advanced Probe Card Technologies Published on October 22, 2026 in Press Release View All News, Events and Media Webinars on Demand Quantum and CryoCMOS: Enabling the Future of Computing with Advanced Test & Measurement Tools Register now to view this Event Next Generation DC Probes for Accurate and Repeatable Device Modelling Measurements Register now to view this Event Considerations for Vertical High Probe Count Testing Register now to view this Event Scaling Measurement Methodologies Using Cryogenic TaaS Framework for Higher Quality cryo-LNAs and Reliable Qubit Readout Chains Register now to view this Event View All Webinars Privacy Policy Web Terms of Use ©2026, FormFactor. All Rights Reserved. Sales Portal | Service Portal ProductsProbe Systems Probes Probe Cards Quantum Cryogenics ApplicationsSemiconductor R&D Test High Volume Production Partner Solutions Technical Papers IndustriesComputing, Data Centers and Quantum 5G & 6G Communications Automotive Aerospace and Defense Sales & ServiceGlobal Contact Info Contact Sales Parts & Service Request Sales Portal Service Portal CompanyCareers Investors Leadership Board of Directors Legal Security & Compliance News, Events and MediaPress Releases COMPASS Users Conference Webinars Blog Loading...enusen-US1793941681https://formfactor.com

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